Search Results for Reliability. - Narrowed by: Sharma, Ashok K., author.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026qf$003dAUTHOR$002509Yazar$002509Sharma$00252C$002bAshok$002bK.$00252C$002bauthor.$002509Sharma$00252C$002bAshok$002bK.$00252C$002bauthor.$0026ps$003d300?2024-08-11T22:36:59ZSemiconductor memories : technology, testing, and reliabilityent://SD_ILS/0/SD_ILS:151962024-08-11T22:36:59Z2024-08-11T22:36:59ZYazar Sharma, Ashok K., author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Electronic Resources<br/>Advanced semiconductor memories : architectures, designs, and applicationsent://SD_ILS/0/SD_ILS:152402024-08-11T22:36:59Z2024-08-11T22:36:59ZYazar Sharma, Ashok K., author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562</a><br/>Format: Electronic Resources<br/>