Search Results for Mathematical analysis. - Narrowed by: Electronic Resources - Industrial engineering.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dMathematical$002banalysis.$0026qf$003dFORMAT$002509Format$002509ER$002509Electronic$002bResources$0026qf$003dSUBJECT$002509Konu$002509Industrial$002bengineering.$002509Industrial$002bengineering.$0026ps$003d300?2024-08-29T00:21:49ZMathematical Analysis of Continuum Mechanics and Industrial Applications II Proceedings of the International Conference CoMFoS16ent://SD_ILS/0/SD_ILS:2219642024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar van Meurs, Patrick. editor.<br/><a href="https://doi.org/10.1007/978-981-10-6283-4">https://doi.org/10.1007/978-981-10-6283-4</a><br/>Format: Electronic Resources<br/>Research Advances in Industrial Engineeringent://SD_ILS/0/SD_ILS:227432024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Davim, J. Paulo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-17825-7">http://dx.doi.org/10.1007/978-3-319-17825-7</a><br/>Format: Electronic Resources<br/>Design of Experiments in Production Engineeringent://SD_ILS/0/SD_ILS:168842024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Davim, J. Paulo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-23838-8">http://dx.doi.org/10.1007/978-3-319-23838-8</a><br/>Format: Electronic Resources<br/>Basic Transport Phenomena in Materials Engineeringent://SD_ILS/0/SD_ILS:249242024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Iguchi, Manabu. author.<br/><a href="http://dx.doi.org/10.1007/978-4-431-54020-5">http://dx.doi.org/10.1007/978-4-431-54020-5</a><br/>Format: Electronic Resources<br/>Stochastic Modeling of Thermal Fatigue Crack Growthent://SD_ILS/0/SD_ILS:219742024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Radu, Vasile. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-12877-1">http://dx.doi.org/10.1007/978-3-319-12877-1</a><br/>Format: Electronic Resources<br/>Chemical Reactor Modeling Multiphase Reactive Flowsent://SD_ILS/0/SD_ILS:206022024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Jakobsen, Hugo A. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-05092-8">http://dx.doi.org/10.1007/978-3-319-05092-8</a><br/>Format: Electronic Resources<br/>Solid Modeling and Applications Rapid Prototyping, CAD and CAE Theoryent://SD_ILS/0/SD_ILS:2248582024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Um, Dugan. author.<br/><a href="https://doi.org/10.1007/978-3-319-74594-7">https://doi.org/10.1007/978-3-319-74594-7</a><br/>Format: Electronic Resources<br/>Manufacturing Scheduling Systems An Integrated View on Models, Methods and Toolsent://SD_ILS/0/SD_ILS:195132024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Framinan, Jose M. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4471-6272-8">http://dx.doi.org/10.1007/978-1-4471-6272-8</a><br/>Format: Electronic Resources<br/>Transactions on Engineering Technologiesent://SD_ILS/0/SD_ILS:191242024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Ao, Sio-iong. editor.<br/><a href="http://dx.doi.org/10.1007/978-981-10-1088-0">http://dx.doi.org/10.1007/978-981-10-1088-0</a><br/>Format: Electronic Resources<br/>Engineering Asset Management 2011 Proceedings of the Sixth World Congress on Engineering Asset Managementent://SD_ILS/0/SD_ILS:194662024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Lee, Jay. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4471-4993-4">http://dx.doi.org/10.1007/978-1-4471-4993-4</a><br/>Format: Electronic Resources<br/>Proceedings of the International Conference on Research and Innovations in Mechanical Engineering ICRIME-2013ent://SD_ILS/0/SD_ILS:250472024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Khangura, Sehijpal Singh. editor.<br/><a href="http://dx.doi.org/10.1007/978-81-322-1859-3">http://dx.doi.org/10.1007/978-81-322-1859-3</a><br/>Format: Electronic Resources<br/>Advances in Italian Mechanism Science Proceedings of the First International Conference of IFToMM Italyent://SD_ILS/0/SD_ILS:2211262024-08-29T00:21:49Z2024-08-29T00:21:49ZYazar Boschetti, Giovanni. editor.<br/><a href="https://doi.org/10.1007/978-3-319-48375-7">https://doi.org/10.1007/978-3-319-48375-7</a><br/>Format: Electronic Resources<br/>