Search Results for Applications of Mathematics. - Narrowed by: Electronic Book - IEEE - Electronic books.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dApplications$002bof$002bMathematics.$0026qf$003dITYPE$002509Materyal$002bT$0025C3$0025BCr$0025C3$0025BC$0025091$00253AE-BOOKS$002509Electronic$002bBook$0026qf$003dLOCATION$002509Lokasyon$0025091$00253AIEEE$002509IEEE$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300?2024-08-02T02:06:32ZTransient analysis of power systems : solution techniques, tools, and applicationsent://SD_ILS/0/SD_ILS:156692024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Martinez-Velasco, Juan A., author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6987689">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6987689</a><br/>Format: Electronic Resources<br/>Risk assessment of power systems : models, methods, and applicationsent://SD_ILS/0/SD_ILS:151152024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Li, Wenyuan, author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312</a><br/>Format: Electronic Resources<br/>Risk assessment of power systems : models, methods, and applicationsent://SD_ILS/0/SD_ILS:156372024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Li, Wenyuan, 1946-<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6774612">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6774612</a><br/>Format: Electronic Resources<br/>Direct methods for stability analysis of electric power systems : theoretical foundation, BCU methodologies, and applicationsent://SD_ILS/0/SD_ILS:154352024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Chiang, H., (Hsiao-Dong), author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732791</a><br/>Format: Electronic Resources<br/>Probabilistic transmission system planningent://SD_ILS/0/SD_ILS:154272024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Li, Wenyuan, author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732783">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732783</a><br/>Format: Electronic Resources<br/>Optimization principles : practical applications to the operation and markets of the electric power industryent://SD_ILS/0/SD_ILS:151212024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Rau, Narayan S. author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263054">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263054</a><br/>Format: Electronic Resources<br/>Plane-wave theory of time-domain fields : near-field scanning applicationsent://SD_ILS/0/SD_ILS:151782024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Hansen, Thorkild, 1965-<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263885">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263885</a><br/>Format: Electronic Resources<br/>The story of electrical and magnetic measurements : from 500 B.C. to the 1940sent://SD_ILS/0/SD_ILS:152312024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Keithley, Joseph F., author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265284">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265284</a><br/>Format: Electronic Resources<br/>Radio system design for telecommunicationsent://SD_ILS/0/SD_ILS:149752024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Freeman, Roger L. author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201442">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201442</a><br/>Format: Electronic Resources<br/>Handbook of applied algorithms : solving scientific, engineering and practical problemsent://SD_ILS/0/SD_ILS:149932024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Stojmenović, Ivan.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201533">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201533</a><br/>Format: Electronic Resources<br/>Introduction to biomedical imagingent://SD_ILS/0/SD_ILS:153032024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Webb, Andrew (Andrew G.) author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273528">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273528</a><br/>Format: Electronic Resources<br/>Ultrasonic inspection technology development and search units design : examples of practical applicationsent://SD_ILS/0/SD_ILS:155102024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Brook, Mark V., author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6105608">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6105608</a><br/>Format: Electronic Resources<br/>Fourier analysis on finite groups with applications in signal processing and system designent://SD_ILS/0/SD_ILS:151042024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Stankoviâc, Radomir S., author.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237943">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237943</a><br/>Format: Electronic Resources<br/>Contemporary issues in systems science and engineeringent://SD_ILS/0/SD_ILS:156922024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Zhou, MengChu.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=7089495">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=7089495</a><br/>Format: Electronic Resources<br/>SOI lubistors : lateral, unidirectional, bipolar-type insulated-gate transistorsent://SD_ILS/0/SD_ILS:156172024-08-02T02:06:32Z2024-08-02T02:06:32ZYazar Omura, Y. (Yasuhisa), auteur.<br/>Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628862">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628862</a><br/>Format: Electronic Resources<br/>