Search Results for Algorithms. - Narrowed by: Engineering. - Quality Control, Reliability, Safety and Risk.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dAlgorithms.$0026qf$003dSUBJECT$002509Konu$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Konu$002509Quality$002bControl$00252C$002bReliability$00252C$002bSafety$002band$002bRisk.$002509Quality$002bControl$00252C$002bReliability$00252C$002bSafety$002band$002bRisk.$0026ps$003d300?2024-08-29T02:34:53ZPractical Acoustic Emission Testingent://SD_ILS/0/SD_ILS:187082024-08-29T02:34:53Z2024-08-29T02:34:53ZYazar Society for Non-Destructive Inspection, The Japanese. editor.<br/><a href="http://dx.doi.org/10.1007/978-4-431-55072-3">http://dx.doi.org/10.1007/978-4-431-55072-3</a><br/>Format: Electronic Resources<br/>Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthdayent://SD_ILS/0/SD_ILS:175312024-08-29T02:34:53Z2024-08-29T02:34:53ZYazar Fiondella, Lance. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-30599-8">http://dx.doi.org/10.1007/978-3-319-30599-8</a><br/>Format: Electronic Resources<br/>Intelligent Monitoring, Control, and Security of Critical Infrastructure Systemsent://SD_ILS/0/SD_ILS:244672024-08-29T02:34:53Z2024-08-29T02:34:53ZYazar Kyriakides, Elias. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-662-44160-2">http://dx.doi.org/10.1007/978-3-662-44160-2</a><br/>Format: Electronic Resources<br/>Software Design for Resilient Computer Systemsent://SD_ILS/0/SD_ILS:173632024-08-29T02:34:53Z2024-08-29T02:34:53ZYazar Schagaev, Igor. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-29465-0">http://dx.doi.org/10.1007/978-3-319-29465-0</a><br/>Format: Electronic Resources<br/>Process Control Theory and Applicationsent://SD_ILS/0/SD_ILS:2269992024-08-29T02:34:53Z2024-08-29T02:34:53ZYazar Corriou, Jean-Pierre. author.<br/><a href="https://doi.org/10.1007/978-3-319-61143-3">https://doi.org/10.1007/978-3-319-61143-3</a><br/>Format: Electronic Resources<br/>