Search Results for - Narrowed by: Electronic circuits. - Quality Control, Reliability, Safety and Risk. - Electronic BookSirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026qf$003dSUBJECT$002509Konu$002509Quality$002bControl$00252C$002bReliability$00252C$002bSafety$002band$002bRisk.$002509Quality$002bControl$00252C$002bReliability$00252C$002bSafety$002band$002bRisk.$0026qf$003dITYPE$002509Materyal$002bT$0025C3$0025BCr$0025C3$0025BC$0025091$00253AE-BOOKS$002509Electronic$002bBook$0026ps$003d300?2024-06-19T05:51:04ZSoftware Design for Resilient Computer Systemsent://SD_ILS/0/SD_ILS:173632024-06-19T05:51:04Z2024-06-19T05:51:04ZYazar Schagaev, Igor. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-29465-0">http://dx.doi.org/10.1007/978-3-319-29465-0</a><br/>Format: Electronic Resources<br/>Engineering Safe and Secure Cyber-Physical Systems The Specification PEARL Approachent://SD_ILS/0/SD_ILS:173022024-06-19T05:51:04Z2024-06-19T05:51:04ZYazar Gumzej, Roman. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-28905-2">http://dx.doi.org/10.1007/978-3-319-28905-2</a><br/>Format: Electronic Resources<br/>Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthdayent://SD_ILS/0/SD_ILS:175312024-06-19T05:51:04Z2024-06-19T05:51:04ZYazar Fiondella, Lance. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-30599-8">http://dx.doi.org/10.1007/978-3-319-30599-8</a><br/>Format: Electronic Resources<br/>Circuit Design for Reliabilityent://SD_ILS/0/SD_ILS:196082024-06-19T05:51:04Z2024-06-19T05:51:04ZYazar Reis, Ricardo. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-4078-9">http://dx.doi.org/10.1007/978-1-4614-4078-9</a><br/>Format: Electronic Resources<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:199132024-06-19T05:51:04Z2024-06-19T05:51:04ZYazar Bhushan, Manjul. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-1349-7">http://dx.doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodesent://SD_ILS/0/SD_ILS:195932024-06-19T05:51:04Z2024-06-19T05:51:04ZYazar Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>Bias Temperature Instability for Devices and Circuitsent://SD_ILS/0/SD_ILS:196802024-06-19T05:51:04Z2024-06-19T05:51:04ZYazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>