Search Results for - Narrowed by: Electronic circuits. - Computer-aided engineering. SirsiDynix Enterprise https://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026qf$003dSUBJECT$002509Konu$002509Computer-aided$002bengineering.$002509Computer-aided$002bengineering.$0026ps$003d300? 2024-05-17T05:55:56Z Power Amplifiers for the S-, C-, X- and Ku-bands An EDA Perspective ent://SD_ILS/0/SD_ILS:17248 2024-05-17T05:55:56Z 2024-05-17T05:55:56Z Yazar&#160;Božanić, Mladen. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-28376-0">http://dx.doi.org/10.1007/978-3-319-28376-0</a><br/>Format:&#160;Electronic Resources<br/> VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers ent://SD_ILS/0/SD_ILS:18366 2024-05-17T05:55:56Z 2024-05-17T05:55:56Z Yazar&#160;Shin, Youngsoo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-46097-0">http://dx.doi.org/10.1007/978-3-319-46097-0</a><br/>Format:&#160;Electronic Resources<br/> Circuit Design for Reliability ent://SD_ILS/0/SD_ILS:19608 2024-05-17T05:55:56Z 2024-05-17T05:55:56Z Yazar&#160;Reis, Ricardo. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-4078-9">http://dx.doi.org/10.1007/978-1-4614-4078-9</a><br/>Format:&#160;Electronic Resources<br/> AIDA-CMK: Multi-Algorithm Optimization Kernel Applied to Analog IC Sizing ent://SD_ILS/0/SD_ILS:22471 2024-05-17T05:55:56Z 2024-05-17T05:55:56Z Yazar&#160;Louren&ccedil;o, Ricardo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-15955-3">http://dx.doi.org/10.1007/978-3-319-15955-3</a><br/>Format:&#160;Electronic Resources<br/> Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits ent://SD_ILS/0/SD_ILS:23979 2024-05-17T05:55:56Z 2024-05-17T05:55:56Z Yazar&#160;Yu, Wenjian. author.<br/><a href="http://dx.doi.org/10.1007/978-3-642-54298-5">http://dx.doi.org/10.1007/978-3-642-54298-5</a><br/>Format:&#160;Electronic Resources<br/>