Search Results for - Narrowed by: Circuits and Systems. - Physics.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dSUBJECT$002509Konu$002509Circuits$002band$002bSystems.$002509Circuits$002band$002bSystems.$0026qf$003dSUBJECT$002509Konu$002509Physics.$002509Physics.$0026ps$003d300$0026isd$003dtrue?2024-05-19T22:04:57ZUltra-Low-Voltage Design of Energy-Efficient Digital Circuitsent://SD_ILS/0/SD_ILS:224992024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Reynders, Nele. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-16136-5">http://dx.doi.org/10.1007/978-3-319-16136-5</a><br/>Format: Electronic Resources<br/>Design of Arithmetic Circuits in Quantum Dot Cellular Automata Nanotechnologyent://SD_ILS/0/SD_ILS:225872024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Sridharan, K. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-16688-9">http://dx.doi.org/10.1007/978-3-319-16688-9</a><br/>Format: Electronic Resources<br/>Flash Memories Economic Principles of Performance, Cost and Reliability Optimizationent://SD_ILS/0/SD_ILS:251932024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Richter, Detlev. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-6082-0">http://dx.doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Electronic Resources<br/>Semiconductor Technologies in the Era of Electronicsent://SD_ILS/0/SD_ILS:253962024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Kang, Yong Hoon. author.<br/><a href="http://dx.doi.org/10.1007/978-94-017-8768-0">http://dx.doi.org/10.1007/978-94-017-8768-0</a><br/>Format: Electronic Resources<br/>Poly-SiGe for MEMS-above-CMOS Sensorsent://SD_ILS/0/SD_ILS:252072024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Gonzalez Ruiz, Pilar. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-6799-7">http://dx.doi.org/10.1007/978-94-007-6799-7</a><br/>Format: Electronic Resources<br/>Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applicationsent://SD_ILS/0/SD_ILS:253302024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Franco, Jacopo. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-7663-0">http://dx.doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithmsent://SD_ILS/0/SD_ILS:253392024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Zjajo, Amir. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-7781-1">http://dx.doi.org/10.1007/978-94-007-7781-1</a><br/>Format: Electronic Resources<br/>Energy-Efficient Fault-Tolerant Systemsent://SD_ILS/0/SD_ILS:196102024-05-19T22:04:57Z2024-05-19T22:04:57ZYazar Mathew, Jimson. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-4193-9">http://dx.doi.org/10.1007/978-1-4614-4193-9</a><br/>Format: Electronic Resources<br/>