Search Results for - Narrowed by: Springer E-Book Collection - Quality Control, Reliability, Safety and Risk. - Electronic circuits. SirsiDynix Enterprise https://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dLOCATION$002509Lokasyon$0025091$00253ASPRINGER$002509Springer$002bE-Book$002bCollection$0026qf$003dSUBJECT$002509Konu$002509Quality$002bControl$00252C$002bReliability$00252C$002bSafety$002band$002bRisk.$002509Quality$002bControl$00252C$002bReliability$00252C$002bSafety$002band$002bRisk.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300? 2024-05-19T02:11:35Z Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthday ent://SD_ILS/0/SD_ILS:17531 2024-05-19T02:11:35Z 2024-05-19T02:11:35Z Yazar&#160;Fiondella, Lance. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-30599-8">http://dx.doi.org/10.1007/978-3-319-30599-8</a><br/>Format:&#160;Electronic Resources<br/> Software Design for Resilient Computer Systems ent://SD_ILS/0/SD_ILS:17363 2024-05-19T02:11:35Z 2024-05-19T02:11:35Z Yazar&#160;Schagaev, Igor. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-29465-0">http://dx.doi.org/10.1007/978-3-319-29465-0</a><br/>Format:&#160;Electronic Resources<br/> Engineering Safe and Secure Cyber-Physical Systems The Specification PEARL Approach ent://SD_ILS/0/SD_ILS:17302 2024-05-19T02:11:35Z 2024-05-19T02:11:35Z Yazar&#160;Gumzej, Roman. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-28905-2">http://dx.doi.org/10.1007/978-3-319-28905-2</a><br/>Format:&#160;Electronic Resources<br/> Circuit Design for Reliability ent://SD_ILS/0/SD_ILS:19608 2024-05-19T02:11:35Z 2024-05-19T02:11:35Z Yazar&#160;Reis, Ricardo. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-4078-9">http://dx.doi.org/10.1007/978-1-4614-4078-9</a><br/>Format:&#160;Electronic Resources<br/> CMOS Test and Evaluation A Physical Perspective ent://SD_ILS/0/SD_ILS:19913 2024-05-19T02:11:35Z 2024-05-19T02:11:35Z Yazar&#160;Bhushan, Manjul. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-1349-7">http://dx.doi.org/10.1007/978-1-4939-1349-7</a><br/>Format:&#160;Electronic Resources<br/> Design for Manufacturability From 1D to 4D for 90&ndash;22 nm Technology Nodes ent://SD_ILS/0/SD_ILS:19593 2024-05-19T02:11:35Z 2024-05-19T02:11:35Z Yazar&#160;Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format:&#160;Electronic Resources<br/> Bias Temperature Instability for Devices and Circuits ent://SD_ILS/0/SD_ILS:19680 2024-05-19T02:11:35Z 2024-05-19T02:11:35Z Yazar&#160;Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format:&#160;Electronic Resources<br/>