Search Results for - Narrowed by: Springer E-Book Collection - Microelectronics. - Grasser, Tibor. editor.
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2024-05-26T20:40:34Z
Hot Carrier Degradation in Semiconductor Devices
ent://SD_ILS/0/SD_ILS:21272
2024-05-26T20:40:34Z
2024-05-26T20:40:34Z
Yazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-08994-2">http://dx.doi.org/10.1007/978-3-319-08994-2</a><br/>Format: Electronic Resources<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:19680
2024-05-26T20:40:34Z
2024-05-26T20:40:34Z
Yazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>