Search Results for - Narrowed by: Springer E-Book Collection - Electronics. - Reliability.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dLOCATION$002509Lokasyon$0025091$00253ASPRINGER$002509Springer$002bE-Book$002bCollection$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Konu$002509Reliability.$002509Reliability.$0026ps$003d300$0026isd$003dtrue?2024-06-25T05:31:24ZFunctional Safety for Road Vehicles New Challenges and Solutions for E-mobility and Automated Drivingent://SD_ILS/0/SD_ILS:178402024-06-25T05:31:24Z2024-06-25T05:31:24ZYazar Ross, Hans-Leo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-33361-8">http://dx.doi.org/10.1007/978-3-319-33361-8</a><br/>Format: Electronic Resources<br/>Occupational Injuries From Electrical Shock and Arc Flash Eventsent://SD_ILS/0/SD_ILS:164812024-06-25T05:31:24Z2024-06-25T05:31:24ZYazar Campbell, Richard B. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-6508-3">http://dx.doi.org/10.1007/978-1-4939-6508-3</a><br/>Format: Electronic Resources<br/>Reliable Design of Electronic Equipment An Engineering Guideent://SD_ILS/0/SD_ILS:212882024-06-25T05:31:24Z2024-06-25T05:31:24ZYazar Natarajan, Dhanasekharan. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-09111-2">http://dx.doi.org/10.1007/978-3-319-09111-2</a><br/>Format: Electronic Resources<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:199132024-06-25T05:31:24Z2024-06-25T05:31:24ZYazar Bhushan, Manjul. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-1349-7">http://dx.doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:237692024-06-25T05:31:24Z2024-06-25T05:31:24ZYazar Birolini, Alessandro. author.<br/><a href="http://dx.doi.org/10.1007/978-3-642-39535-2">http://dx.doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodesent://SD_ILS/0/SD_ILS:195932024-06-25T05:31:24Z2024-06-25T05:31:24ZYazar Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>Bias Temperature Instability for Devices and Circuitsent://SD_ILS/0/SD_ILS:196802024-06-25T05:31:24Z2024-06-25T05:31:24ZYazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>