Search Results for - Narrowed by: Springer E-Book Collection - 2014 - Electronic circuits. - Electronics and Microelectronics, Instrumentation. - Quality Control, Reliability, Safety and Risk.
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2024-06-21T03:54:21Z
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
ent://SD_ILS/0/SD_ILS:19593
2024-06-21T03:54:21Z
2024-06-21T03:54:21Z
Yazar Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:19680
2024-06-21T03:54:21Z
2024-06-21T03:54:21Z
Yazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>