Search Results for - Narrowed by: Grasser, Tibor. editor. - Springer E-Book Collection - Engineering. - Microelectronics.
SirsiDynix Enterprise
https://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qf$003dAUTHOR$002509Yazar$002509Grasser$00252C$002bTibor.$002beditor.$002509Grasser$00252C$002bTibor.$002beditor.$0026qf$003dLOCATION$002509Lokasyon$0025091$00253ASPRINGER$002509Springer$002bE-Book$002bCollection$0026qf$003dSUBJECT$002509Konu$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Konu$002509Microelectronics.$002509Microelectronics.$0026ps$003d300$0026isd$003dtrue?
2024-09-26T13:07:54Z
Hot Carrier Degradation in Semiconductor Devices
ent://SD_ILS/0/SD_ILS:21272
2024-09-26T13:07:54Z
2024-09-26T13:07:54Z
Yazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-08994-2">http://dx.doi.org/10.1007/978-3-319-08994-2</a><br/>Format: Electronic Resources<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:19680
2024-09-26T13:07:54Z
2024-09-26T13:07:54Z
Yazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>