
Characterization of Wide Bandgap Power Semiconductor Devices
Title:
Characterization of Wide Bandgap Power Semiconductor Devices
Author:
Wang, Fei (Fred)
ISBN:
9781785614927
Personal Author:
Publication Information:
Stevenage : IET, 2018.
Physical Description:
1 online resource (376 p.)
Series:
Energy Engineering
Energy Engineering.
Abstract:
The book has 11 chapters and covers the following topics: Pulsed static characterization; Junction capacitance characterization; Fundamentals of dynamic characterization; Gate drive for dynamic characterization; Layout design and parasitic management; Protection design for double pulse test; Measurement and data processing for dynamic characterization; Cross-talk consideration; Impact of three-phase system; Topology consideration; and Appendices on Recommended equipment and components list for DPT setup; and Data processing code for dynamic characterization are given.
Electronic Access:
http://dx.doi.org/10.1049/PBPO128E